IEC 61508:2010 - Functional Safety of E/E/PE Safety-related Systems
Part 2, Clause 7: E/E/PE lifecycle (hardware) – IEC 61508:2010 - Functional Safety of E/E/PE Safety-related Systems

IEC 61508:2010 - Functional Safety of E/E/PE Safety-related Systems 2-7.4.4.2: Part 2, 7.4.4.2 Route 1H

Under Route 1H the maximum claimable SIL is found by defining the subsystems; determining each element's safe failure fraction individually at zero fault tolerance (redundant configurations may count comparison diagnostics); reading the element's maximum SIL from Table 2 (type A) or Table 3 (type B); combining elements within each subsystem; and taking the lowest subsystem result as the system's maximum SIL. For subsystems of several elements of the same type whose SFFs fall in the same one of the four SFF bands of the tables, the subsystem fault tolerance and SFF may be read straight from Tables 2 and 3. For elements in series the lowest element result governs; for parallel channels with fault tolerance N, each channel is first assessed as a series group, and the best channel's SIL is raised by N.

Maintained by Gerard Blokdyk

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  • 5:8 8 Evaluation of the hardware architectural metrics

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