Digital components include the digital parts of microcontrollers, systems on chip and ASICs; their fault models are permanent (stuck-at, open-circuit, bridging, single event hard error) and transient (single event transient, single event upset, single bit upset, multiple cell upset and multiple bit upset), with detailed fault models for memories; failure modes are defined per part and subpart with examples for common blocks, and the guidance covers qualitative and quantitative analysis with a worked example, notes on quantitative analysis, verification using fault injection simulation, an example of the safety documentation of a digital component, examples of safety mechanisms (ECC, parity, lockstep, watchdogs, built-in self-test, redundancy) and an overview of techniques for digital components.
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