Safety analyses of the hardware design (per part 9 clause 8) identify the causes and effects of faults, inductive analysis recommended at every ASIL and deductive analysis highly recommended for ASIL C and D, and establish for each safety-related hardware element whether its faults are safe, single-point, residual or multiple-point, with the safety mechanisms' effectiveness evidenced; part 11 4.1 and 4.4 apply this to semiconductors. Sub-clause title from the held contents page; the clause's objectives quoted by a certification body; requirement text not held.
This control maps to 1 controls across 1 other frameworks. If you already hold one of them, the evidence you collected for it is the starting point here rather than new work.
Every mapping shown was judged rather than inferred from wording similarity, and the ones that failed review are published too. See the coverage reports and what was rejected.
The graph holds this control, the 1 it maps to, and the evidence behind each claim, over MCP and REST.